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Simultaneous Multiple Optimizations

It is possible to simultaneously optimize two PR parameters using both the Low Speed (LS) and High Speed (HS) Lock Ins by using one on the Main Scan Line and the other on the Interleave Scan Line.

  1. Set Interleave Mode to Interleave:

  1. Set the Piezo Response (Interleave) Lock-In Type to High Speed and the other Interleave Piezo Response parameters as shown:

  1. Set the Scan Line for Channel 6, Channel 7 and Channel 8 to Interleave:

  1. Assign the following Data Types:
  1. In the Generic Sweep window, select the Main radio button and optimize the LS PR Inphase signal using the procedure Optimize the Image.

  1. Select the Interleave radio button and optimize the HS PR Quadrature signal using the procedure Optimize the Image.
  2. Re-scan the sample. The optimized images are shown below:

Additional information about the piezoresponse mode can be found in Piezoresponse Atomic Force Microscopy Using a NanoScope V Controller, Bruker p/n 013-444-000.

Previous Steps:

  1. Piezoresponse Procedure Set Up
  2. Write an Area in the Piezoelectric Sample
  3. Image the Written Area
  4. Optimize the Image

 

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