Photo-Induced Force Microscope

Description of the instrument

This photo-induced force microscope (PiFM) is an instrument which makes it possible to obtain topographic (resolution 40nm) and spectroscopic (IR between 770 and 1910 cm-1 with a resolution of 5nm) images. The PiFM technique uses a field, at the top of a tip, to locally induce a bias in the sample, which in turn produces an additional force acting on the tip. This photo-induced force can be extracted from the oscillation properties of the cantilever, and thus make it possible to obtain images of IR photo-induced forces.

Model : Molecular Vista, Vista One
Room : PK-2759

User Fees

Academic fees Industrial fees
$7.75/h $77.50/h

Add $47.50/h if manipulations are performed by an operator. Add 15% administrative costs if industrial user. The price of consumables (piFM tips) is not included.

Terms of use

For external users, please communicate imperatively with Maziar Jafari.

For internal users, all users must undergo training with Maziar Jafari before using this equipment.

To make an online reservation, please click on the following link.