NanoQAM AFM in Découvrir

Observation of objects on a nanometric scale

The NanoQAM Center at the University of Quebec in Montreal (UQAM) has developed expertise in observing objects on a nanometric scale. Last May, he acquired a new device: an atomic force microscope (AFM). The latter makes it possible to identify the roughness on a given surface measuring between 0.25 nanometer (carbon atom) and 80 microns (edge of a hair).

The Nano: minisector, maxi-ambitions

This surface is faithfully “topographed” by an extremely fine point which can be composed, among other things, of silicon or gold. A small horizontal arm holds this point (like a vinyl record player) and sweeps the plane horizontally, while making light movements from top to bottom, following the relief. The principle of the forces of Wan der Waals wants atoms tend to attract each other, except when they are too close; in the latter case, they repel each other. The tip is kept in balance very close to the surface analyzed.

From the accumulated data, a three-dimensional image is produced using image acquisition and processing software that allows details to be viewed. It is also possible to manipulate the image to highlight certain aspects such as the thickness of the object. 3D imaging is particularly useful for observing microfossils.