Description of the instrument

This profilometer, located in a clean room, allows to characterize the topography of a surface with a lateral resolution of 1nm. This instrument also allows stress measurement and 3D mapping. Direct applications of this type of instrument are: thickness measurement of thin layers, stress measurement, roughness measurement, and 3D representation of surfaces.

Model : Bruker, Dektak XT
Room : PK-2273

User Fees

Academic rates Industrial rates
$7.75/h $77.50/h

Add $47.50/h if the operations are carried out by an operator. Add 15% of administrative costs if industrial user.

Terms of use

For external users, please communicate imperatively with Galyna Shul.

For internal users, all users must undergo training with Galyna Shul before using this equipment.

To make an online reservation, please click on the following link.