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| start [2020/04/03 15:03] – [Microscopy and size measurements] administrateur | start [2020/04/03 18:28] (current) – removed administrateur | ||
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| - | ====== Instruments ======= | ||
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| - | ==== Nanomaterials synthesis ==== | ||
| - | * High Temperature Tubular furnace(GSL-1500-50-UL) | ||
| - | * High Temperature Tubular furnace (Lindberg/ | ||
| - | * High Temperature Tubular furnace (OTF-1200X-III) | ||
| - | * Solvent Purification System (MB-SPS) | ||
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| - | ==== Thermal characterizations ==== | ||
| - | * Thermogravimetric analyzer (TGA Q500) | ||
| - | * TGA coupled MS (TGA Q500/ | ||
| - | * Differential modulated scanning calorimetry (DSC 1) | ||
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| - | ==== Spectroscopic characterizations ==== | ||
| - | * X-ray diffractometer (D8 Advance) | ||
| - | * NMR 600MHz (Avance III HD) | ||
| - | * Solid NMR 400MHz (Avance III HD) | ||
| - | * Raman microscope (inVia) | ||
| - | * ICP coupled OES (5100) | ||
| - | * [[spectraa220z|Atomic absorption / Graphite furnace]] (SpectrAA 220 Z) | ||
| - | * [[spectraa220fs|Atomic absorption / emission]] (SpectrAA 220 FS) | ||
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| - | ==== Microscopy and size measurements ==== | ||
| - | * Zeta Potential / Particle Size Analyzer (ZetaPlus/ | ||
| - | * Particle Size Analyzer (Zetasizer Nano S90) | ||
| - | * [[multimode8|Atomic Force Microscope]] (MultiMode8) | ||
| - | * Profilometer (Dektak XT) | ||
| - | * Optical microscope (Eclipse LV150) | ||
| - | * Optical microscope in clean room (Eclipse LV150) | ||
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| - | ==== Optical characterizations ==== | ||
| - | * UV-Visible-PIR spectrometer (Lambda 750) | ||
| - | * FTIR-ATR spectrometer (Nicolet 6700 / Smart iTR) | ||
| - | * Steady-state spectrofluorimeter (QuantaMaster 40) | ||
| - | * Nanotube spectrometer (NS2) | ||
| - | * Micro-plate reader (Infinite M200) | ||
| - | * Spectrofluorimeter (LS45) | ||
| - | * FTIR spectrometer (4700) | ||
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| - | ==== Electrochemical measurements ==== | ||
| - | * 8 Channels Battery Analyzers (BST8-WA) | ||
| - | * Four-terminal sensing (S-302) | ||
| - | * 8-way Multi-Potentiostats (VMP3) | ||
| - | * Multi-Potentiostats + Frequency Analyzer (1470/ | ||
| - | * Quartz Crystal Electrochemical Nanobalance (QCA922) | ||
| - | * Solar Simulator (SS0.5KW) | ||
| - | * Glove box characterizations (N/A) | ||
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| - | ==== Chromatographies ==== | ||
| - | * GC/MS " | ||
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| - | ==== Physical characterizations ==== | ||
| - | * Dynamic Tensiometer (DCAT11) | ||
| - | * Viscometer (VC-10) | ||
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| - | ==== Printing systems ==== | ||
| - | * Materials Printer (DMP 2800) | ||
| - | * Lithography - Mask Aligner (Hydralign Series 2000) | ||
| - | * Aerosol spray printing (Aerosol Jet) | ||
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| - | ==== Deposition systems ==== | ||
| - | * Parylene deposition system (Labcoter 2 PDS 2010) | ||
| - | * Deposit system / Evaporator (N/A) | ||
| - | * Deposit system / Evaporator (in glove box) (MB Evap) | ||
| - | * Spin-coating (clean room) (WS-200-4C) | ||
| - | * Spin-coating (WS-200-4C) | ||
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| - | ==== Engravings and surface treatments ==== | ||
| - | * Plasma cleaning system (PICO) | ||
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start.1585926210.txt.gz · Last modified: 2020/04/03 15:03 by administrateur