Differences

This shows you the differences between two versions of the page.

--- multimode8 [2020/04/08 17:51] – [Manuals] administrateur
+++ multimode8 [2020/04/08 20:36] (current) – [References] administrateur
@@ Line 12: / Line 12: @@
   * {{ :an045-reva1-exploring_the_high_temperature_afm_and_its_use_for_studies_of_polymers-appnote.pdf |Exploring the High Temperature AFM}}
   * {{ :an049-reva1-tappingmode_atomic_force_microscopy_operation_in_fluid-appnote.pdf |Tapping Mode Atomic Force Microscopy - Operation in Fluid}}
-  * {{ :torsional_resonance_mode_support_note_v6-h_013-402-000_.pdf |Torsional Resonance Mode - Support Note}}
+  * {{ :support_note_trmode_v7-j_013-416-000_.pdf |Torsional Resonance Mode - Support Note}} (Rev.I)
+  * {{ :force_imag_supplement-f_013-228-000_.pdf |Force Measurements}} (Rev.F)
 ==== Manuals ====
   * [[http://nanoqam.ca/help/Multimode/DIcon_webhelp_CSH.htm|MultiMode 8 User Guide]] (intranet)
   * {{ :nanoscope_software_8.10_user_guide-d_004-1025-000_.pdf |Nanoscope software - User guide}} (v8.10)
+  * {{ :nanoscope_v_controller_manual-f_004-992-000_.pdf |NanoScope V - Controller Manual}} (Rev. F)
   * {{ :application_modules_nanoscope_software_version_7-c_004-1020-000_.pdf |Application modules Nanoscope}} (v7-c)
   * {{ :omv_opt_viewing_system-c_013-213-000_.pdf |NanoScope Optical Viewing System}}
@@ Line 28: / Line 30: @@
   * {{ :224d-scanning_capacitance.pdf |Scanning Capacitance Microscopy (SCM)}}
   * {{ :004-1016-000_electrochemical_spm_manual_version_7-d.pdf |Electrochemical SPM - Manual}} (v7-d)
-  * {{ :013-390-000-revd_ec_bipotentiostat.pdf |ElectroChemical Bipotentiostat manual}} (Rev.D)
+  * {{ :universal_bipotentiostat-e_013-390-000_.pdf |Universal Bi-Potentiostat manual}} (Rev.E)
   * {{ :fluid_operation-d_013-290-000_.pdf |Guidelines for Fluid Operation with a MultiMode AFM}} (Re.vD)
@@ Line 52: / Line 54: @@
 ==== Guides ====
-  * {{ :004-130e_spmtrainingntbk.pdf |Scanning Probe Microscopy - Training Notebook}}
+  * {{ :manual_training-f_004-130-000_.pdf |Scanning Probe Microscopy - Training Notebook}} (Rev. F)
   * {{ :peakforce_qnm_tutorial.pdf |PeakForce QNM - Tutorial}}
   * {{ :spm_guide_0829_05_166.pdf |Practical guide to Scanning Probe Microscopy (SPM)}}
@@ Line 61: / Line 63: @@
 ==== References ====
-  * {{ :atomic_force_microscopy.pdf |Atomic Force Microscopy}}
+  * {{ :surface_characterization_by_spectroscopy_and_microscopy.pdf |Surface Characterization by Spectroscopy and Microscopy}}
-  * {{ :atomic_force_microscopy_-_understanding_basic_modes_and_advanced_applications.pdf |Atomic Force Microscopy - Understanding Basic Modes and Advanced Applications}}
+  * {{ :scanning_probe_microscopy_theory.pdf |Scanning Probe Microscopy, Theory}}
-  * {{ :atomic_force_microscopy_-_methods_and_protocols.pdf |Atomic Force Microscopy - Methods and Protocols}}
+  * {{ :scanning_probe_microscopes.pdf |Scanning Probe Microscopes}}
-  * {{ :atomic_force_microscopy_in_analysis_of_polymers.pdf |Atomic Force Microscopy in Analysis of Polymers}}
+  * {{ ::scanning_probe_microscopy_applications.pdf |Scanning Probe Microscopy, Applications}}
-  * {{ :scanning_probe_microscopy_-_afm_and_stm.pdf |Scanning Probe Microscopy - AFM and STM}}